KT-4DG

HK$0.00

Highly advanced ATE+BTT single step DDR4 DRAM device tester

Highly advanced ATE+BTT single step DDR4 DRAM device tester

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Key Features

  • Btt up to 1.600Gbps, ATE up to 3Gbps

  • Parallel Support: 128 Duts, x8 Base

  • Supports Low Power and Wide I/O

  • Compact: Very small footprint, no special air, power, or cooling requirements

Specs

  • Standard device level contact, leakage, IDD, Btt, PPG and PMU testing

  • Full suite of test patterns provided

  • 128 DUTs in parallel (x8), up to 256 with dual chassis option

  • Higher performance and more capabilities

  • Active HiFix (driving electronics inside HiFix)

  • Supports Low Power and Wide I/O

  • Adjustable clocks: tRC, tRCD, tRASmin, tRASmax, tRP, tRRD, tWTR, tRTW, tRFC, tAL, tCWL, tRTP

  • Address Generation: 16 Rows + 15 Columns + 4 Bank Selects

  • Automated DDR4 read/write leveling

  • Programmable Pattern Generator (PPG): March, X, Y, G, LR, LRD, IFA 13 etc, + IDD tests – all including IDD6

KTI Standard Features:

  • Failure/Design Analysis Tools including Shmoo and Burn-in

  • Simple drag and drop test flow creation

  • Full test flow control including looping, binning, etc.

  • Fully programmable pattern generator – we provide you many industry standard patterns, but you can write your own too!

  • Enhanced SPD programming tool including Address Tests, Write Protect tests and activation, date/time/serial number stamps, DDR4 Temperature testing, etc.

  • Enhanced software customization available – data logging and analysis, tester flow control, bar code scanning, etc.